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1 m e m o r y all data sheets are subject to change without notice (858) 503-3300 - fax: (858) 503-3301- www.maxwell.com 3.3v 1 megabit (128k x 8-bit) 28lv011 ?2002 maxwell technologies all rights reserved. eeprom 05.28.02 rev 2 f eatures : ? 3.3v low voltage operation 128k x 8 bit eeprom r ad -p ak ? radiation-hardened against natural space radiation total dose hardness: - > 100 krad (si), depending upon space mission excellent single event effects: - sel th > 84 mev/mg/cm 2 - seu th > 37 mev/mg/cm 2 (read mode) - seu saturated cross section = 3e-6 cm 2 (read mode) - seu th = 11.4 mev/mg/cm 2 (write mode) - seu saturated cross section = 5e-3 cm 2 (write mode) with hard errors package: - 32 pin r ad -p ak ? flat pack - 32 pin r ad -p ak ? dip - jedec-approved byte-wide pinout address access time: - 200, 250 ns access times available high endurance: - 10,000 erase/write (in page mode), 10-year data retention page write mode: - 1 to 128 bytes automatic programming - 15 ms automatic page/byte write low power dissipation - 20 mw/mhz active current (typ.) - 72 w standby (maximum) d escription : maxwell technologies? 28lv011 high density, 3.3v, 1 megabit eeprom microcircuit features a greater than 100 krad (si) total dose tolerance, depending upon space mission. the 28lv011 is capable of in-system electrical byte and page pro- grammability. it has a 128-byte page programming function to make its erase and write operations faster. it also features data polling and a ready/busy signal to indicate the comple- tion of erase and programming operations. in the 28lv011, hardware data protection is provided with the res pin, in addi- tion to noise protection on the we signal and write inhibit on power on and off. meanwhile, software data protection is implemented using the jedec-optional standard algorithm. the 28lv011 is designed for high reliability in the most demanding space applications. maxwell technologies' patented r ad -p ak ? packaging technol- ogy incorporates radiation shielding in the microcircuit pack- age. it eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. in a geo orbit, r ad -p ak ? provides greater than 100 krad (si) radiation dose tolerance. this product is available with screening up to class s. note:the recommended form of data protection during power on/off is to hold the res pin to v ss during power up and power down. this may be accompanied by connecting the res pin to the cpu reset line. failure to provide adequate protection during power on/off may result in lost or modified data. high voltage generator control logic timing address buffer and latch y decoder x decoder y gating memory array i/o buffer and input latch data latch v cc v ss res oe ce we res a0 a6 a7 a16 i/o0 i/o7 rdy/busy logic diagram 28lv011
m e m o r y 2 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 t able 1. 28lv011a p inout d escription p in s ymbol d escription 12-5, 27, 26, 23, 25, 4, 28, 3, 31, 2 a0-a16 address 13-15, 17-21 i/o0 - i/o7 input/output 24 oe output enable 22 ce chip enable 29 we write enable 32 v cc power supply 16 v ss ground 1 rdy/busy ready/busy 30 res reset t able 2. 28lv011 a bsolute m aximum r atings p arameter s ymbol m in m ax u nit supply voltage (relative to vss) v cc -0.6 7.0 v input voltage (relative to vss) v in -0.5 1 1. v in min = -3.0 v for pulse width < 50 ns. 7.0 v operating temperature range t opr -55 125 c storage temperature range t stg -65 150 c t able 3. d elta l imits p arameter v ariation i cc 1 10% i cc 2 10% i cc 3a 10% i cc 3b 10%
m e m o r y 3 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 t able 4. 28lv011 r ecommended o perating c onditions p arameter symbol min max unit supply voltage v cc 3.0 3.6 v input voltage res _pin v il v ih v h -0.3 1 2.0 2 v cc -0.5 1. v il min = -1.0 v for pulse width < 50 ns. 2. v ih min = 2.2 v for v cc = 3.6 v. 0.8 v cc +0.3 v cc +1 v operating temperature range t opr -55 +125 c t able 5. 28lv011 c apacitance (t a = 25c, f = 1mh z ) p arameter s ymbol m in m ax u nit input capacitance: v in = 0v 1 1. guaranteed by design. c in -- 6 pf output capacitance: v out = 0v 1 c out -- 12 pf t able 6. 28lv011 dc e lectrical c haracteristics (v cc = 3.3v 0.3, t a = -55 to +125c unless otherwise specified ) p arameter t est c onditions s ubgroups s ymbol m in m ax u nit input leakage current v cc = 3.6v, v in = 3.6v 1, 2, 3 i li -- 2 a output leakage cur- rent v cc = 3.6v, v out = 3.6v/0.4v 1, 2, 3 i lo -- 2 a standby v cc current ce = v cc ce = v ih 1, 2, 3 i cc1 i cc2 -- -- 20 1 a ma operating v cc current i out = 0ma, duty = 100%, cycle = 1 s @ v cc = 3.3v i out = 0ma, duty = 100%, cycle = 250 ns @ v cc = 3.3v 1, 2, 3 i cc3 -- -- 6 15 ma input voltage 1, 2, 3 v il v ih v h -- 2.0 1 v cc -0.5 1. v ih min = 2.2v for v cc = 3.6v. 0.8 -- -- v output voltage i ol = 2.1 ma i oh = -400 a 1, 2, 3 v ol v oh -- v cc x0.8 0.4 -- v
m e m o r y 4 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 t able 7. 28lv011 ac c haracteristics for r ead o peration 1 (v cc = 3.3v 10%, t a = -55 to +125 c unless otherwise specified ) 1. test conditions: input pulse levels - 0.4v to 2.4v; input rise and fall times < 20 ns; output load - 1 ttl gate + 100 pf (inc luding scope and jig); reference levels for measuring timing - 0.8v/1.8v. p arameter t est c onditions s ubgroups s ymbol m in m ax u nit functional test verify truth table 7, 8a, 8b all address access time -200 -250 ce = oe = v il , we = v ih 9, 10, 11 t acc -- -- 200 250 ns chip enable access time -200 -250 oe = v il , we = v ih 9, 10, 11 t ce -- -- 200 250 ns output enable access time -200 -250 ce = v il , we = v ih 9, 10, 11 t oe 0 0 110 120 ns output hold to address change -200 -250 ce = oe = v il , we = v ih 9, 10, 11 t oh 0 0 -- -- ns output disable to high-z 2 -200 -250 2. t df and t dfr is defined as the time at which the output becomes an open circuit and data is no longer driven. ce = v il , we = v ih ce = oe = v il , we = v ih 9, 10, 11 t df 0 0 50 50 ns output disable to high-z -200 -250 ce = v il , we = v ih ce = oe = v il , we = v ih 9, 10, 11 t dfr 0 0 300 350 ns res to output delay 3 -200 -250 3. guaranteed by design. ce = oe = v il we = v ih 9, 10, 11 t rr 0 0 525 550 ns
m e m o r y 5 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 t able 8. 28lv011 ac e lectrical c haracteristics for e rase and w rite o perations (v cc = 3.3v 10%, t a = -55 to +125 c unless otherwise specified ) p arameter s ubgroups s ymbol m in m ax u nit address setup time -200 -250 9, 10, 11 t as 0 0 -- -- ns chip enable to write setup time (we controlled) -200 -250 9, 10, 11 t cs 0 0 -- -- ns write pulse width (ce controlled) -200 -250 9, 10, 11 t cw 200 250 -- -- ns write pulse width (we controlled) -200 -250 9, 10, 11 t wp 200 250 -- -- ns address hold time -200 -250 9, 10, 11 t ah 125 150 -- -- ns data setup time -200 -250 9, 10, 11 t ds 100 100 -- -- ns data hold time -200 -250 9, 10, 11 t dh 10 10 -- -- ns chip enable hold time (we controlled) -200 -250 9, 10, 11 t ch 0 0 -- -- ns write enable to write setup time (ce controlled) -200 -250 9, 10, 11 t ws 0 0 -- -- ns write enable hold time (ce controlled) -200 -250 9, 10, 11 t wh 0 0 -- -- ns output enable to write setup tim -200 -250 9, 10, 11 t oes 0 0 -- -- ns output enable hold time -200 -250 9, 10, 11 t oeh 0 0 -- -- ns write cycle time 1,2 -200 -250 9, 10, 11 t wc -- -- 15 15 ms
m e m o r y 6 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 byte load cycle -200 -250 9, 10, 11 t blc 1 1 30 30 s data latch time 2 -200 -250 9, 10, 11 t dl 700 750 -- -- ns byte load window 2 -200 -250 9, 10, 11 t bl 100 100 -- -- s time to device busy -200 -250 9, 10, 11 t db 100 120 -- -- ns write start time -200 -250 9, 10, 11 t dw 250 250 -- -- ns res to write setup time 2 -200 -250 9, 10, 11 t rp 100 100 -- -- s v cc to res setup time 2 -200 -250 9, 10, 11 t res 1 1 -- -- s 1. t wc must be longer than this value unless polling techniques or rdy/bsy are used. this device automatically completes the internal write operation within this value. 2. guaranteed by design. t able 9. 28lv011 m ode s election 1,2 m ode ce oe we res rdy/busy i/o read v il v il v ih v h high-z d out standby v ih x x x high-z high-z write v il v ih v il v h high-z --> v ol d in deselect v il v ih v ih v h high-z high-z write inhibit x x v ih x-- -- xv il x x -- -- data polling v il v il v ih v h v ol data out (i/o7) program x x x v il high-z high-z 1. x = don?t care. 2. refer to the recommended dc operating conditions. t able 8. 28lv011 ac e lectrical c haracteristics for e rase and w rite o perations (v cc = 3.3v 10%, t a = -55 to +125 c unless otherwise specified ) p arameter s ubgroups s ymbol m in m ax u nit
m e m o r y 7 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 1. r ead t iming w aveform
m e m o r y 8 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 2. b yte w rite t iming w aveform (1) (we c ontrolled )
m e m o r y 9 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 3. b yte w rite t iming w aveform (2) (ce c ontrolled )
m e m o r y 10 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 4. p age w rite t iming w aveform (1) (we c ontrolled )
m e m o r y 11 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 5. p age w rite t iming w aveform (2) (ce c ontrolled ) f igure 6. s oftware d ata p rotection t iming w aveform (1) ( in protection mode )
m e m o r y 12 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 7. s oftware d ata p rotection t iming w aveform (2) ( in non - protection mode ) f igure 8. d ata p olling t iming w aveform
m e m o r y 13 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 9. t oggle b it w aveform f igure 10. seu s aturated c ross s ection v alues in r ead m ode 28lv010 read mode cross-section 1.00e-07 1.00e-06 1.00e-05 1.00e-04 1.00e-03 1.00e-02 0 102030405060708090 let [mev-cm^2/mg] cross-section [cm^2] lv1 lv2 lv5 lv6
m e m o r y 14 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f igure 11. seu s aturated c ross s ection v alues in w rite m ode eeprom a pplication n otes this application note describes the programming procedures for the eeprom modules and with details of various techniques to preserve data protection. automatic page write page-mode write feature allows 1 to 128 bytes of data to be written into the eeprom in a single write cycle, and allows the undefined data within 128 bytes to be written corresponding to the undefined address (a0 to a6). loading the first byte of data, the data load window opens 30 s for the second byte. in the same manner each additional byte of data can be loaded within 30 s. in case ce and we are kept high for 100s after data input, eeprom enters erase and write mode automatically and only the input data are written into the eeprom. we ce pin operation during a write cycle, addresses are latched by the falling edge of we or ce , and data is latched by the rising edge of we or ce . data polling data polling function allows the status of the eeprom to be determined. if eeprom is set to read mode during a write cycle, an inversion of the last byte of data to be loaded outputs from i/o 7 to indicate that the eeprom is per- forming a write operation. 28lv010 write mo de average cro s s -s ectio n 1.00e-06 1.00e-05 1.00e-04 1.00e-03 1.00e-02 1.00e-01 0 102030405060708090 let [mev-cm^2/mg] cross-section [cm^2] sl1 sl2 sl3 n4 n5
m e m o r y 15 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 rdy/busy signal rdy/busy signal also allows a comparison operation to determine the status of the eeprom. the rdy/busy signal has high impedance except in write cycle and is lowered to v ol after the first write signal. at the-end of a write cycle, the rdy/busy signal changes state to high impedance. res signal when res is low, the eeprom cannot be read and programmed. therefore, data can be protected by keeping res low when v cc is switched. res should be high during read and programming because it doesn?t provide a latch function. data protection to protect the data during operation and power on/off, th e eeprom has the internal functions described below. 1. data protection against noise of control pins (ce , oe , we ) during operation. during readout or standby, noise on the control pins may act as a trigger and turn the eeprom to programming mode by mis- take. to prevent this phenomenon, the eeprom has a noise cancellati on function that cuts noise if its width is 20 ns or less in programming mode. be careful not to allow noise of a width of more than 20 ns on the control pins. 2. data protection at v cc on/off
m e m o r y 16 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 when v cc is turned on or off, noise on the control pins generated by ex ternal circuits, such as cpus, may turn the eeprom to programming mode by mistake. to prevent this unintentional programming, the eeprom must be kept in unprogrammable state during v cc on/off by using a cpu reset signal to res pin. res should be kept at v ss level when v cc is turned on or off. the eeprom breaks off programming operation when res become low, programming operation doesn?t finish correctly in case that res falls low during programming operation. res should be kept high for 10 ms after the last data input. 3. software data protection the software data protection function is to prevent unintentional programming caused by noise gener ated by external circuits. in software data protection mode, 3 bytes of data must be input before write data as follows. these bytes can switch the non- protection mode to the protection mode. software data protection mode can be canceled by inputting the foll owing 6 bytes. then, the eeprom turns to the non-protec- tion mode and can write data normally. however, when the data is input in the canceling cycle, the data cannot be written.
m e m o r y 17 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 f32-01 note: all dimensions in inches 32-p in r ad -p ak ? f lat p ackage s ymbol d imension m in n om m ax a 0.117 0.130 0.143 b 0.015 0.017 0.022 c 0.003 0.005 0.009 d -- 0.820 0.830 e 0.404 0.410 0.416 e1 -- -- 0.440 e2 0.234 0.240 -- e3 0.030 0.085 -- e 0.050bsc l 0.350 0.370 0.390 q 0.020 0.035 0.045 s1 0.005 0.027 -- n32
m e m o r y 18 all data sheets are subject to change without notice ?2002 maxwell technologies all rights reserved. 3.3v 1 megabit (128k x 8-bit) eeprom 28lv011 05.28.02 rev 2 important notice: these data sheets are created using the chip manufacturers published specifications. maxwell technologies verifies functionality by testing key parameters either by 100% testing, sample testing or characterization. the specifications presented within these data sheets represent the latest and most accurate information available to date. however, these specifications are subject to change without notice and maxwell technologies assumes no responsibility for the use of this information. maxwell technologies? products are not authorized for use as critical components in life support devices or systems without express written approval from maxwell technologies. any claim against maxwell technologies must be made within 90 days from the date of shipment from maxwell tech- nologies. maxwell technologies? liability shall be limited to replacement of defective parts.

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